SWTest 2025

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SWTest 2025

The Semiconductor Wafer Test Conference (SWTest) is celebrating over 30 years as the only industry event that focuses on all the aspects associated with microelectronic wafer and die level testing. The conference has the perfect mixture of manufacturer and vendor presentations. It is a probe technology forum where attendees come to learn about recent developments in the industry and exchange ideas.

  • 開催日: 2025年6月2 – 4日
  • 会場: Omni La Costa, Carlsbad, SD, CA, USA
  • ブース番号: 412/414
  • 参加部門: Probe Card | Celadon

 

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