製品紹介
MPI TITAN™ シングルエンド & デュアルプローブ
DC〜250 GHz 広帯域プロービングソリューション
次世代RF、ミリ波、高速デジタル対応
TITAN™ T250MA & T250MS Probes
Probe Card
Photonics Automation
AST
Thermal
Celadon
Lightium, MPI Corporation, and Axiomatic_AI Announce Strategic Partnership to Revolutionize Photonic Integrated Circuit (PIC) Device Testing with AI-Driven Solutions
Zurich, Switzerland; Hsinchu, Taiwan; and Boston, USA – Aug. 5th, 2025
Lightium AG, MPI Corporation, and Axiomatic_AI Inc. have entered into a Memorandum of Understanding (MoU) to jointly develop the world’s first Intelligent, Autonomous, and Integrated Test Solution (IAITS)...
Lightium, MPI Corporation, and Axiomatic_AI Announce Strategic Partnership to Revolutionize Photonic Integrated Circuit (PIC) Device Testing with AI-Driven Solutions
先端半導体テスト
ニュース
SEMICON JAPAN 2025
SEMICON JAPAN 2025
プローブカード | フォトニクス･オートメーション |
先端半導体テスト
イベント
開催日: 2025年12月17 – 19日
会場: 東京ビッグサイト
ブース番号: W3242
MPI Corporation’s Advanced Semiconductor Test Division Achieves Fully Traceable RF Calibration Breakthrough Up to 110 GHz
MPI Corporation’s Advanced Semiconductor Test Division Joins Forces with Keysight Technologies as a Keysight Solutions Partner
先端半導体テスト
ニュース
Hsinchu, Taiwan – March 11, 2024
MPI Corporation, a global leader in semiconductor testing solutions, is pleased to announce a landmark partnership with Keysight Technologies, a global innovation partner delivering market-leading design, emulation, and test solutions to help engineers develop and deploy faster. This collaboration marks...
MPI Corporation’s Advanced Semiconductor Test Division Achieves Fully Traceable RF Calibration Breakthrough Up to 110 GHz
MPI Corporation’s Advanced Semiconductor Test Division Achieves Fully Traceable RF Calibration Breakthrough Up to 110 GHz
先端半導体テスト
ニュース
Braunschweig, Germany, January 25, 2024
MPI Corporation’s Advanced Semiconductor Test (AST) Division, a pioneer in on-wafer testing solutions, today announced a landmark achievement in RF calibration technology. Collaborating with the Physikalisch-Technische Bundesanstalt (PTB)...
MPI SENTIO® and QAlibria® Unsurpassed Usability is Now Extended to Automated Four-Port RF System Calibration
MPI SENTIO® and QAlibria® Unsurpassed Usability is Now Extended to Automated Four-Port RF System Calibration
先端半導体テスト
ニュース
Hsinchu, Taiwan, December 8, 2022
MPI Corporation’s Advanced Semiconductor Test Division, an industry and innovation leader in semiconductor RF test solutions, demonstrated unattended four-port RF calibration and measurements supported by the new versions of QAlibria® and SENTIO®, MPI’s...
WLR Product Advancements from MPI Corporation & Celadon Systems Inc.
WLR Product Advancements from MPI Corporation & Celadon Systems Inc.
ニュース
MPI America Inc, a wholly owned subsidiary of MPI Corporation Taiwan, and recognized globally as a leader in semiconductor test, is pleased to announce Wafer Level Reliability solutions in combination with Celadon Systems advanced technologies. This is proof positive that...
2022年3月17日、カリフォルニア州サンノゼ (San Jose, CA)
Slide 2 - TS2000-SE Configured with the New MPI THZ-Selection
TS2000-IFE Series – THZ Selection
先端半導体テスト
製品情報
THZ-Selection converts the TS2000-IFE into a dedicated, RF, mmW, THZ and load-pull probe station, as first one on the market without compromising measurement directivity and accuracy at wide temperature range from -60°C to +300°C.
Celadon Multisite Tile-on-Card™ Production Probe Card
Celadon Multisite Tile-on-Card™ Production Probe Card
セラドン
製品情報
Functional Test, 200C, Production Probe Card
Celadon Cryogenic Minitile™
Celadon Cryogenic Minitile™
セラドン
製品情報
Cryogenic, 4K and 77K, Positioner Mounted, 22 pin Probe Card
Celadon VC20™, 45e™ Probe Card Adaptor, and Insertion Tool
Celadon VC20™, 45e™ Probe Card Adaptor, and Insertion Tool
セラドン
製品情報
Modular, -65C to 200C, 48 channel, probe card and adaptor, used for Modeling, Characterization, Parametric Test, and WLR testing
Celadon VC43™ and P9000 Production Parametric Probe Card
Celadon VC43™ and P9000 Production Parametric Probe Card
セラドン
製品情報
Modular, -65 to 200C, 100 channel, Probe Card
Slide 2 - TS2000-SE Configured with the New MPI THZ-Selection
The Latest in mmWave and THz Test and Measurement Technology
先端半導体テスト
ニュース
This eBook is a collection of articles on the various innovations in measurement methods and equipment that has been developed to address these higher frequencies ranging from mmWave up to 1.1 THz. (This eBook was published by Microwave Journal)